Starting in January the course is intended for students with a background in physics or similar.
This 7.5 hp course focuses on hard X-ray interaction with matter. The topics covered include:
- X-ray sources
- Scattering and absorption
- Refraction and reflection from interfaces, refractive index
- X-ray optics
- Scattering from non-crystalline material, small angle X-ray scattering (SAXS).
- Scattering from crystalline material: X-ray diffraction (XRD), Fourier transform, reciprocal lattice, Ewald’s sphere.
- Scanning X-ray diffraction, surface X-ray diffraction
- Photoelectric absorption, X-ray absorption spectroscopy (XAS/EXAFS)
- X-ray fluorescence (XRF), emission spectroscopy, scanning X-ray fluorescence spectroscopy (XRF)
- X-ray detectors
- X-ray imaging: scanning transmission, tomography
- Coherent X-ray imaging: phase contrast, phase retrieval, holography, ptychography
- Neutron scattering
The course is based on the book Als-Nielsen, J. & McMorrow, D. (2011). Elements of modern X-ray physics, 2nd ed. The book can be found online http://onlinelibrary.wiley.com/book/10.1002/9781119998365. It is recommend to get a copy if you take the course.
There will be two classes per week and a few hand-in assignments, two lab exercises, a visit to MAXIV, and an exam.
More information and registration
If you have further questions, please contact Jesper Wallentin at jesper [dot] wallentin [at] sljus [dot] lu [dot] se (jesper[dot]wallentin[at]sljus[dot]lu[dot]se)